A Study on the Application of Deep Learning Image Segmentation Techniques in Product Defect Analysis

Abstract

This paper investigates the application of deep learning image segmentation algorithms in product defect detection. First, by analyzing the limitations of traditional methods in this domain, the key challenges faced by conventional approaches are identified. Subsequently, the advantages and specific applications of deep learning-based image segmentation techniques in product defect detection are examined in detail. The findings are intended to serve as a valuable reference for relevant researchers and practitioners in the field.